AI Powered Image Detection Software

Sandbox Semiconductor is rolling out an AI powered image detection software for finding critical dimensions in SEM and TEM images. They have graciously volunteered a virtual demonstration of this software to the SNF community. There will be a "viewing party" in the SNF office area (where Process Clinic usually takes place). If you cannot attend in the viewing party, email Alex Denton who can provide a link to the meeting.

More information about the software can be found on the Sandbox website and a paper from the Proceedings of the SPIE provides some additional details: