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Microchemical Analysis Facility

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Stanford Nano Labs | Credit: Linda Cicero

MAF is equipped with a state-of-the-art JEOL JXA-8230 “SuperProbe” electron microprobe. The electron microprobe measures the elemental compositions of solid samples by detecting the X-rays emitted on excitation by a focused electron beam, down to a spatial resolution of about 1 micron.

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