Christie Jilly
Christie is a research scientist specializing in secondary ion mass spectroscopy (SIMS). She serves as a lab manager for the Cameca NanoSIMS 50L instrument in the Stanford Nano Shared Facilities, as well as the SHRIMP-RG secondary ion mass spectrometer in the Stanford School of Earth, Energy & Environmental Sciences. Prior to Stanford, Christie received her Ph.D. in Geology and Geophysics from the University of Hawaii at Manoa, utilizing their Cameca 1280 IMS ion microprobe for isotopic analyses of meteoritic materials, as well as SEM/EDS and EPMA for sample characterization. She completed a postdoc at UC Berkeley Space Sciences Laboratory, where she gained experience in numerous other microanalytical techniques, including FIB, TEM, and synchrotron XANES, to study the chemical composition of comet grains and meteorites.